2019年6月25日上午9:30，故障診斷與容錯控制領域國際權威學者Ronald J. Patton教授應邀在将軍路校區伟德 官网1号樓403會議室做題為“Fault-Tolerant Control, viewed as a Robust Control Design Problem”的學術報告，會議由伟德 官网齊瑞雲教授主持，伟德 官网部分師生參加了報告會。
Patton教授在報告會中指出容錯控制的目的是在執行器、傳感器出現故障或系統參數發生變化時保持控制系統的性能。通過适當的反饋設計，可以使系統具有“容錯”特性，并且可以将故障視為加性和乘性不确定性。魯棒性和容錯性是密切相關的概念，即參數變化和故障可能是閉環系統行為中不希望有的影響，也可以表現為在某些實時條件下可以估計的附加故障影響。因此，容錯控制器是一種利用各種強有力的手段實現魯棒控制的方法，其中加性和參數性故障實際上是作用于系統中的不确定性。對不确定性的魯棒性和容錯性都可以通過估計和控制的聯合或集成問題來處理。與此密切相關的是分離原理，在過去的45年來它在控制理論中已廣為人知。在這種背景下，考慮估計對不确定系統和系統控制變化的魯棒性，從而理解“聯合魯棒性”是很重要的。
報告會中将概述這些原則，從而為實現良好的容錯控制和對實際應用問題的魯棒性提供策略，這對我們航空航天為背景的故障診斷和容錯控制科學研究非常具有借鑒意義。
最後，Patton教授與到場的師生進行了交流互動，耐心解答了師生們所提出的學術問題。講座結束後，Patton教授與到會師生代表合影留念。
報告人簡介：
Ron J. Patton was born in Peru in 1949. He graduated at Sheffield University with BEng, MEng, PhD degrees in Electrical & Electronic Engineering and Control Systems. Ron holds the Chair in Control & Intelligent Systems Engineering at Hull University and has made a substantial contribution during 38 years to the field of modelling and Robust methods for FDI/FDD (fault detection and isolation/fault detection and diagnosis) and Fault-Tolerant Control (FTC) in dynamic systems. He has Hirsch Index h_58 and is author of 428 papers, including 158 archival journal papers and 5 books. Ron is Subject Editor of the Wiley Journal of Adaptive Control & Signal Processing. He has served on editorial boards of several other Journals in Control Engineering. During 1996-2002 Ron chaired the IFAC Safeprocess Technical Committee providing the mechanism for running of the 2006 IFAC Safeprocess 2006 Symposium held at Tsinghua University. Ron coordinated the EU research projects IQ2FD [1997-2000] and DAMADICS [2000-2004] and contributed to FP6 NeCST [2004-2007] and FP7 ADDSAFE [2010-2013], as well as to 13 UK research council grants. Current research interests are: Robust multiple-model and de-centralized strategies for FDI/FDD & FTC and Renewable Energy including mitigation of unbalanced loads in wind turbines and wave to wire control of wave energy conversion. He is Life Fellow of IEEE, Senior Member of AIAA and Fellow of the Institute of Measurement and Control.
